Materials Today Tools and Techniques News - 19 Mar 2010
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Raman microscope features Swift technology Horiba Scientific has launched the Xplora Raman microscope with Swift confocal Raman image operation. More Micromeritics to showcase instruments at Analytica Micromeritics will introduce developments in material characterisation instrumentation at Analytica 2010, which is scheduled to be held at the Munich Trade Fair Centre on 23-26 March. More Mobile metal analyser simplifies onsite analysis Spectro Analytical Instruments has introduced a high-performance mobile metal analyser. More Contraa performs rapid semi-quantitative analysis The Contraa series of high-resolution continuum source atomic absorption spectrophotometers from Analytik Jena allow semi-quantitative measurements to be made quickly. More Thermo Fisher to exhibit latest Niton XRF analyser Thermo Fisher Scientific will demonstrate the Niton XL2 Series - the newest member of its range of Niton handheld handheld x-ray fluorescence (XRF) analysers - at Quality Expo South on 28-29 April. More Graphene support films enable TEM characterisation Electron Microscopy Sciences has announced the addition of graphene transmission electron microscope support films to its product line. More Jeol JEM-ARM200F TEM has atomic resolution The atomic-resolution Jeol JEM-ARM200F transmission electron microscope (TEM) has been purchased by the University of Texas San Antonio. More
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